摘要
电子探针分析含钠、钾的玻璃时,钠和钾元素的特征 X 射线强度随操作条件变化,加速电压越低,电子束电流越小,电子束直径越大,越能使特征 X 射线强度趋于稳定。在电子束扫描状态下进行定量分析可以得到比电子束定点状态下更精确的结果。
The characteristic X—ray intensities Vary with the variation of operating conditions,as the glasses containing Na and K are analysed by means of EPMA.It is pointed out that loweraccelerating potential,smaller probe current and larger probe diameter can make the intensities of thecharacteristic X—ray of Na and K element more stable.A new method is suggested in the paper forquantitative analysing glasses containing Na and K by means of EPMA,in which scanning electronprobe is used.
