一种简便快速的电子衍射谱分析方法

An Approach to Simply and Quickly Analyzing Electron Diffraction Patterns

本文根据特征平行四边形法和N/(1/2)比值法提出了一种简便快速的电子衍射谱分析方法——图表法,由于它以一些简单的操作取代了常用分析法的数据测量和计算过程,因此具有简便、快速、可靠性高等优点。

In this paper, an approach to simply and quickly analyzing electron diffraction patterns is presented according to the existing characteristic parallelogram and N^(1/2) ratio methods, which is here termed diagramming method. Because the conventional analyzing methods of datum-measurement and calculations are replaced by some simple operations, the suggested method is characterized by convenience, quickness and reliance in application.