固体电介质的电老化与击穿新理论和实验

A NEW THEORY AND EXPERIMENT ON ELECTRICAL AGING AND BREAKDOWN OF SOLID DIELECTRICS

根据一级捕获动力学方程,导出高电场下固体电介质中新陷阱产生的动力学理论,从该理论出发,以陷阱密度增加到一定程度作为介质发生电击穿的临界条件,获得高电场下电介质的寿命与电场的指数成正比,这一理论结果与广泛应用的电老化经验公式一致,也与实验结果相符。

According to first-order capture equation, a kinetic theory for trap creation in solid dielectrics is proposed in this paper. Taking a certain trap density as critical condition of electrical breakdown, it is found that the dielectrical lifetime is proportional to the exponent of electrical strength. Such a theory is consistent with the widely used emperical formula and agrees with experimental results.