AFM在团簇物理研究中的应用

Application of atomic force microscope in cluster physics reseach

在HI 1 3串列加速器上首次实现了对碳微集团的加速 ,得到了MeV级的碳微集团束C2 C4 。为了比较 ,也加速了C1 。对产生的碳的微集团束进行了测量 ,并用它们对CR 39塑料核径迹探测器进行了辐照。利用原子力显微镜对C1 C4 在CR 39中的径迹进行了观测。得到了C1 的径迹深度和孔径随能量的变化以及在同一能量下 ,C1

Carbon micro clusters were accelerated by HI 13 tandem accelerator. Beams of C 2 C 4 clusters in MeV energy range have been obtained and measured. The plastic nuclear track detectors CR 39 were irradiated by C 1 C 4 beams. After the chemical etching, the tracks in CR 39 were studied using an atomic force microscope (AFM). Some significant information such as the depth and diameter of the track for C 1 as well as the depth of the track of C 1 C 4 in functions of related energy of clusters were obtained. The results show that AFM observation are very useful in practical application to the quantitative analysis for clusters in the track detector CR 39.