FDTD等效入射波法分析PSTM

An equivalent incident wave method of FDTD for PSTM

本文提出一种简捷有效的方法 ,即等效入射波法分析光子扫描隧道显微镜 (PSTM)。作为验证 ,计算了 3维情况下 ,形貌起伏样品和嵌埋的不同折射率样品 ,S和P极化情况下 ,等高扫描面上的场分布的PSTM图像 ,并与其他方法进行比较。比较表明 ,时域有限差分法 (FDTD)等效入射波法与其他方法已有的结果符合相当好 ,并具有简捷 ,降低对吸收边界的要求 。

A simple and effective method — equivalent incident wave method of FDTD was presented and used for analysis of photon scanning tunneling microscopy(PSTM). As examples, the field intensity of the protrusion and the buried samples with different refractive index at a constant height under the P polarization and S polarization incident illuminating were computed. The results of this method were compared with other methods and they were found in good agreement. The advantages of this method are simple and with reduced absorbing boundary conditions, cell numbers and computer time.