摘要
使用X射线衍射仪、扫描电镜和电子探针微区分析仪等设备研究了TiNi,TiNiPd以及TiNiPd(Ce)三种TiNi Pd形状记忆合金的高温氧化问题。合金在氧化之后产生多层的氧化膜 ,其最外层都是由金红石 (TiO2 )组成。二元合金TiNi的氧化膜呈现明显的两层 ,而TiNiPd合金的氧化膜则为四层。加稀土的TiNiPd(Ce)合金的氧化膜呈现出多层的结构 ,可分为五层。提出TiNiO3 和Ti4 Pd2 O在氧化过程中充当了离子交换的媒介。试验显示 ,氧化后TiNi合金中钛的成分损失不大 ;而TiNiPd和TiNiPd(Ce)合金氧化后 ,钛的成分减少很多 。
The high temperature oxidation behaviors of TiNi-Pd series alloys, i.e. TiNi?TiNiPd and TiNiPd(Ce) shape memory alloys, have been investigated by using X-Ray diffractometer, scanning electron microscope and electron probe micro analyzer. The oxidation scale exhibits multi-layer structure and the surface layer consists of rutile TiO 2. TiNi scale shows two layers while TiNiPd four and TiNiPd(Ce) five. After oxidation, there is a slight Ti loss on the surface matrix of TiNi alloy, while the Ti loss on the same place of both TiNiPd and TiNiPd(Ce) is significant, and a linear decrease of microhardness from the surface to the inner part of the alloy was observed.
出处
《理化检验（物理分册）》
CAS
2003年第6期279-283,287,共6页
Physical Testing and Chemical Analysis(Part A:Physical Testing)
基金
上海市科技发展基金 (0 0JC14 0 5 5 )
