PTCR伏安特性测试曲线中的数学模型

Models Used in V-I Measuring Curve of PTCR

详细分析了正温度系数热敏电阻(PTCR)静态伏安特性曲线的特征,在此基础上介绍了处理伏安特性测试数据的数学方法——最小二乘法和自然样条函数法。并将实际测试数据用本方法拟合结果与通用数据拟和软件Origin拟合结果进行了比较。结果表明:本方法拟合的曲线跟Origin拟合的结果趋势非常接近,绘制的曲线更加平滑,更加接近实际。

Analyses the static volt-ampere characteristic curve of positive temperature coefficient thermal resistor (PTCR) in detail.Recommend a mathematics method to deal with testing datum of PTCR's volt-ampere characteristic on this basis-Least square method and nature sample function method.Compared with the method of software origin,they fit the data very well,what's more,the curve drawn is more smooth,more close to the reality V-I cuvre than by Origin.