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基于SiGe/Si的空穴型共振隧穿二极管 被引量:4

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摘要 用GS400高真空外延设备制备了空穴型双势垒单势阱共振隧道二极管,常温(293K)直流测试数据为PVCR(峰谷电流比)=1.13,Jp(峰值电流)=1.589kA/cm^2,对应的低温(77K)脉冲测试数据为PVCR=1.24,Jp=1.086kA/cm^2,两种情况下,较低的PVCR可归结为Ge2Si1-x/Si异质结构本身的能级特性和热效应。
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2003年第B05期128-131,共4页 半导体学报(英文版)
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参考文献8

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同被引文献23

  • 1宋爱民,郑厚植,杨富华,李月霞,李承芳.利用双势垒结构研究磁场下二维电子的态密度[J].红外与毫米波学报,1994,13(3):165-172. 被引量:2
  • 2赵可沦,房丽敏.双势垒系统伏安特性的数值模拟[J].辽宁大学学报(自然科学版),2005,32(2):118-120. 被引量:1
  • 3王明泉.双势垒结构散射问题的路径积分方法[J].黄淮学刊(自然科学版),1995,11(2):16-19. 被引量:3
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  • 10Han P, Sakuraba M, Jeong Y C, et al. Observation of sharp current peaks in resonant tunneling diode with strained Sio.6Ge0.4/Si(100) grown by low-temperature low-pressure CVD [J]. J CrystGrowt, 2000, 209(2): 315-320.

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