摘要
论述和分析证明了一例自激法测量CVT介损异常的原因为δ端子绝缘下降 ,给出的修正公式可取得较准确的结果。
The abnormal measurement result of dielectric loss of CVT by self excitation method is fully explained and analyzed. It is found out that the cause is the reduction of δ tap insulation and the modified formula is put forward.
出处
《高电压技术》
EI
CAS
CSCD
北大核心
2004年第1期57-58,共2页
High Voltage Engineering
