摘要
本文研究了非晶态Ni_(85-x)Si_(15)Bx合金的结构弛豫对电阻特性的影响。通过等时退火和等温退火两种实验方法研究了室温电阻率和电阻温度系数随退火温度及退火时间的关系。用近自由电子模型及Nagel推广的Ziman理论对实验结果进行了初步分析和讨论。图2,参6。
The influence of structural relaxation on resistance properties of amorphous Ni_(85-x) Si_(15)B_x alloys have been studied. The raiation between the resistivity at room temperature or the temperature coefficient of resistance and annealed temperature or an nealed time have been investigated by isothermal and isochronous heat treatment. The ex perimental results are Nagel generalized Ziman theory. 2figs, 6refs.
出处
《湘潭矿业学院学报》
1992年第2期184-187,共4页
Journal of Xiangtan Mining Institute
关键词
金属玻璃
弛豫
电阻率
amorphous alloys
relaxation
electrical resistivity
/temperature coefficient of resistance
