自动相位步进技术在电子条纹干涉测量中的应用

A New Technique of Electronic Speckle Pattern Interferometry Measurement Using Automatic Phase Stepping

采用闭环增益转换技术,通过一个同步信号或选择一个恰当的反馈环路参数,可得到一个连续的相位步进,实现自动相位步进在光纤光学中电子条纹干涉。这种技术既可用于单点也可用于图像结构的测量。

Using the closed-loop gain switching technique, a synchronization signal or a proper choice of the feedback loop parameters,a sequence of steps and electronic speckle pattern interferometry of automatic phase stepping can be obtained. The technique can be used in both single point and imaging configurations measurements.