电子系统微波接收截面的研究

The microwave receiving area of an electronic system

提出了利用天线测量系统和微波网络分析仪测量电子系统内部指定负载的接收截面的 方法。作为例子，对一电路板特定节点的微波接收截面进行了测量，得到了节点上器件的接收截面Ａｒ和 节点最大接收截面Ａｒ－ｍａｘ（负载与节点处电路板的辐射阻抗共轭匹配）。测量结果表明，接收截面随着入射场的频率变化波动很大，微波相干效应十分明显。接收截面Ａｒ与节点处电路板的辐射阻抗和负载阻抗有关，但最大接收截面Ａｒ－ｍａｘ与负载阻抗无关，为电路板特定点的功率耦合提供了一个上限。

In this paper, a method of measuring the receiving area of a given susceptible element within an electronic system by using the antenna measurement system and microwave network analyzer is presented. As an example, the receiving areas of a given point on the circuit board, which include Ar, the receiving area of the element, and Ar-max, the maximum receiving area when the given point is conjugated-matched, is measured. Measured results indicate that the receiving areas vary greatly with the frequency of the incident wave and the microwave coherent effect is obvious. A. is dependent on both the impedance of the element and the radiation impedance of the circuit board while Ar-max is independent of the load, which gives approximate upper bounds on the power coupling of the given point on the circuit board.