三维相移电子散斑干涉中的位移场分离研究

Study on Isolation of Displacement Fields in 3-D Phase-shifting ESPI

提出一种可将离面位移与面内位移分离的方法。在双光束电子散斑干涉(ESPI)中增加参考光,使其为两光束所共用。实验时,两束光各自独立地对变形物体进行测量,结合相移技术,可分别得到包含离面和面内位移信息的2幅相位图。理论分析表明,只需简单的相位运算就能够将面内位移场与与离面位移场分离。典型的3点弯曲梁实验证实了该方法的可行性。

A novel method for isolating out-of-plane displacement from in-plane displacement was presented. A reference was added to dual beam symmetric illumination electronic speckle pattern interferometry (ESPI) system and was shared by the two illuminations. The two illumination lights were used separately in experiment. Then two phase maps, which include out-of-plane and in-plane displacement, can be obtained with phase shifting techniques. Theoretical analysis shows that out-of-plane displacement can be separated from in-plane displacement only by simple calculation of phase. This method has been proved feasible in typical three-point-bending experiment.