NaI(Tl)闪烁探测器测量γ射线的性能分析

Property Analyzing of NaI(Tl) Scintillation Detector forγ-ray Detecting

本文提出NaI(Tl)闪烁探测器测量γ射线的性能要用灵敏度和垂直分辨率来表征。通过分析灵敏度的影响因素,探讨了灵敏度与灵敏体积的关系,提出了提高灵敏度的技术途径。在分析垂直分辨率影响因素的基础上,提出了提高垂直分辨率的技术途径,给出了确定垂直分辨率的经验公式,通过分析、比较,认为最小可分辨厚度是垂直分辨率的逼近极限。这些结论,对于改进NaI(Tl)闪烁探测器设计,提高闪烁探测器的测量性能具有重要的指导作用。

It is recommended to describeγ-ray measuring property of the NaI(Tl) scintillation detector using sensitivity and vertical resolution. The relationship between sensitivity and sensitivity volume of the scintillation detector is discussed, and the technology ways to raise sensitivity are presented based on analyzing the factors having effect on sensitivity. The technology ways to raise vertical resolution are presented based on analyzing the factors having effect on vertical resolution, and the experimental formula to determine vertical resolution is given out. It is thought that the minimum distinguish thickness is the approximating terminal of vertical resolution through comparing and analyzing the minimum distinguish thickness and vertical resolution. These conclusions have important effect to improve designing of NaI(Tl) scintillation detector and promote the measuring property of NaI(Tl) scintillation detector.