正电子湮没技术用于新型硫铝酸盐基无宏观缺陷水泥的研究

POSITRON ANNIHILATION TECHNIQUE FDR ADVANCED SULPHOALUMINATE-MACRO-DEFECT-FREE CEMENT

探索了正电子湮没技术(positron annihilation technique,PAT)测定硫铝酸盐基无宏观缺(macro-defect-free,MDF)水泥中微细孔的实验方法。结果表明:正电子湮没中等寿命成分(τ2≈330 Ps)的强度I2随水泥中微细孔(<250 A)等的增加而有规律地增大,因此可用I2的大小来表征硫铝酸盐基MDF水泥的密实程度和结构完整性。同时,还将实验结果与水银压入法(mercury instrusion porosimeter,MIP)测试结果进行了对比。

Positron annihilation technique (PAT) was used to investigate the micro-pore in sulphoaluminate-macro-defect-free (MDF) cement. The results show that the intensity I2 of positrons with a moderate life-span (τ 2330 Ps) increases with increase of the numbers of micro-pores (less than 250 A). The compactness and integrity of the MDF cement structure can be characterized by I2. In addition, the results obtained with the PAT and the mercury intrusion porosimeter (MIP) are also compared.