用滤膜法进行稀土氧化物原料组分的X射线荧光光谱分析

THIN-FILM METHOD-XRF DETERMINATION OF THE COMPOSITION OF RARE EARTH OXIDES

本文叙述了用沉淀抽滤法制备薄试样,X射线荧光光谱法测定混合稀土氧化物原料组分的分析方法。本法定量下限为0.01％—0.17％,方法精度为0.85％—14.9％。对几种类型的原料分析结果表明,本法与ICP-AES法结果基本相符。方法简便快速,可用于混合稀土氧化物原料的成分分析。

This paper describes the thin-fihn sample preparation by precipitation-pumping filtering method and the composition of rare earth oxide materials by XRF determination. The determination limits are 0.01％ to 0.17％. The coefficients of variation are in the range of 0.85％ to 14.9％. The analytical results of several kinds of rare earth oxide materials show that this method can be applied to the determination of the composition of rare earth oxide mixtures.