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一种基于概率分析的扫描链动态功耗模型

A Probabilistic Study of Scan-based Testing Power Consumption
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摘要 文章通过对扫描测试期间扫描链跳变统计分析,建立了基于概率统计的扫描链功耗模型。该模型可以对扫描链的动态功耗进行快速准确的估计。在此基础上,依据扫描单元的置1概率重排扫描链能有效地降低扫描功耗。实验结果表明,这种方法是有效可行的。 Test power dissipation is exceedingly high in scan-based environment wherein scan chain transitions during the shift of test data further reflect into significant levels of circuit switching unnecessarily.In this paper,scan chain switching activities is evaluated by analysis which based on test vector and scan cell probability.Reordering scan chain to reduce switching activities is discussed in this paper too.Experimental results are given to prove this analysis methodology is effi-cient and useful for power analysis.
出处 《微电子学与计算机》 CSCD 北大核心 2004年第2期108-112,共5页 Microelectronics & Computer
基金 国家自然科学基金项目(90207002) 国家863计划项目(2001AA111070)
关键词 CMOS电路 概率分析 扫描链 动态功耗模型 电路功耗 静态功耗 动态功耗 Test power dissipation,Scan testing,Probabilistic analysis
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参考文献14

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