摘要
详细描述了进行亚微米、深亚微米光记录和探测的测试仪器,其探测功率可达30mW,最小的探测时间为20ns,探测的最小光点200nm左右,带有CCD观察的系统可方便地定位及进行图像处理,整个测量过程均在计算机控制下进行,操作非常方便.它是对高密度光盘材料记录性能进行测量,以及对深亚微米,乃至纳米记录材料进行研究的有效工具.
An instrument used for recording and detecting sub-micron spot is described in this paper. Its output power on the surface of media is about 30 mW, the minimal pulse width is 20 ns, measuring light spot is about 200 nm with a CCD observing and processing system. The overall measuring process is controlled by a computer. The operation is very convenient. Experimental results show that it's an useful equipment for evaluating optical disk media, fabrication technology and nano-material research.
出处
《测试技术学报》
2003年第4期334-336,共3页
Journal of Test and Measurement Technology
基金
国家自然科学基金会资助(项目号:59832060)
关键词
深亚微米光记录
测试仪器
高密度光盘
光斑测量
spot measuring
sub-micrometer recording
high density optical disk
testing instrument
