摘要
本文讨论了利用正弦直方图校准ADC器件误差的方法 ,分析了它对器件误差、SFDR、SNR的影响。模拟实验表明 ,通过校准和补偿 ,ADC的器件误差可以基本上得到消除 ,各项技术指标得到了较大的改善。特别是SFDR的显著提高 。
This paper discusses the method of ADC error calibration by using sine wave histogram and its influence to chip error, SFDR and SNR.The simulation illustrates that, after calibration and compensation, the chip error can be removed nearly and the specifications can be improved obviously. Especially the great improvement of SFDR has visible application value for realization of large system dynamic range.
出处
《电子测量与仪器学报》
CSCD
2004年第1期61-65,共5页
Journal of Electronic Measurement and Instrumentation