高频介质系统介电性能与相组成的定量关系分析

Analysis on Quantitative Relationship between Dielectric Properties and Phase Structure of High Frequency Dielectric System

采用普通电子陶瓷工艺制备两种高频介质系统ZnO-B2O3-SiO2三元系和Bao-Pbo-Nd2O3-Bi2O3-TiO2五元系,通过XRD分析确定各系统的主晶相,运用衍射峰强度计算法准确测定出各组分的体积百分含量,并代入Lichnetecker对数混合定则,计算出系统的介电性能,获得了分析介质系统介电性能与物相含量之间定量关系的新方法.

Two high frequency dielectric systems of ZnO-B2O3-SiO2 and BaO-PbO-Nd2O3-Bi2O3-TiO2 were prepared by conventional ceramics technology. Through XRD analysis, the main crystal phases were determined. The volume percentage contents of each phase were calculated according to the X-ray diffraction peak intensity. Then, these data were introduced into Lichnetecker Law, from which the dielectric properties of the systems were obtained. This is a new way to analyze quantitative relationship between the dielectric properties and phase contents of dielectric materials.