期刊文献+

成品率驱动下基于模型的掩模版优化算法 被引量:5

An Algorithm for Yield Driven Correction of Layout
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摘要 提出并实现了以分段分类思想为基础的掩模版优化算法 ,它是一种基于模型的光学邻近效应方法 .该算法具有矫正精度高、灵活性强和矫正效率较高的特点 ,适合于版图中关键图形的矫正 .实验表明 ,该优化算法可以实现矫正功能并且具有很好的矫正效果 . The layout correction and optimization algorithm are presented based on the model-based OPC.The algorithm has such merits as high accuracy of correction,high adaptability,and high efficiency,which make it very appropriate to be used in critical features on layout.Tests show this algorithm can successfully deal with correction and with good correction result.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2004年第3期351-357,共7页 半导体学报(英文版)
关键词 掩模 光刻 基于模型的光学邻近矫正 layout optical lithography model-based OPC
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参考文献11

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同被引文献41

  • 1王俊平,郝跃.考虑缺陷形状分布的IC成品率模型[J].Journal of Semiconductors,2005,26(5):1054-1058. 被引量:2
  • 2王俊平,郝跃.基于LS空间的IC真实缺陷图像的分割[J].电子学报,2005,33(5):954-956. 被引量:3
  • 3王国雄.成品率驱动的光刻校正技术[J].半导体技术,2005,30(6):10-13. 被引量:1
  • 4李木军,沈连婠,赵玮,李晓光,范明聪,王晓东,刘雳颋,郑津津.紫外光刻中部分相干光的传播及衍射效应[J].中国科学技术大学学报,2007,37(1):24-29. 被引量:9
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