斜投影显微图像分析法测量片状颗粒厚度的研究

Research on Thickness Measurement of Sheet Particles with Microscopic Image Analysis Method of Oblique Projection

与传统正投影显微图像分析方法不同,本文应用斜投影法,通过变换观测颗粒群的角度,依据获得的光学显微镜下颗粒群的信息,推导出了颗粒群厚度的计算公式,并讨论了厚度分辨能力与倾斜角、放大倍数之间的关系,同时应用实例证明了该方法的可行性。

The token information of particle group under light microscope is o btained based on slant projection. The calculating formula of particle group thi ckness is deduced, then the relation of thickness resolving power, slant angle a nd magnification is discussed.The feasibility of this method is proved through t he example.