期刊文献+

多孔硅对多晶硅太阳电池中缺陷和杂质的吸除效应 被引量:3

GETTERING OF DEFECTS IN POLYCRYSTALLINE SILICON SOLAR CELLS BY POROUS SILICON
下载PDF
导出
摘要 吸杂是减少硅中杂质和缺陷,提高多晶硅太阳电池效率的一种有效手段。本文比较了用三种吸杂方式对多晶硅进行处理的结果和影响:多孔硅吸杂,磷吸杂,多孔硅结合磷吸杂。三种吸杂方式都能明显提高多晶硅的少子寿命。在此基础上研究了多孔硅吸杂的工艺,发现多孔硅吸杂的效果随退火的温度和时间影响比较大,在800℃氮气气氛下退火3h,多晶硅的少子寿命能由原来的1 4μs提高到25 6μs。相比之下,多孔硅吸杂工艺简单,更适合工业生产。 Polycrystalline silicon is the main material of commercial solar cells, but the defects and impurities cause the solar cell with low efficiency. Three ways of gettering of polycrystalline silicon are compared: gettered by porous silicon, gettered by heavy phosphor diffusion and gettered by porous silicon combined with heavy phosphorous diffusion. All these three ways can improve the minority carrier lifetime effectively. Moreover, the parameters of porous silicon getteing were invesigated. The minority carrier lifetime increased from 1.4μs to 25.6μs when the annealing temperature was 800℃ for 3 hours. Compared with the other two ways of gettering, porous silicon gettering was simple and more suitable for the industry of solar cells.
出处 《太阳能学报》 EI CAS CSCD 北大核心 2004年第2期259-262,共4页 Acta Energiae Solaris Sinica
基金 北京新星计划项目(H020821480130) 国家863重大科技计划(G2000028208)
关键词 少子寿命 多孔硅 吸杂 minority carrier lifetime porous silicon gettering
  • 相关文献

参考文献7

  • 1Wang shurong, Chen tingjin, Liu zuming et al. Gettering Studies on Polycrystalline Silicon Solar Cells [J ].Journal of Yunan Normal University, 2001, 21 (6):43-44.
  • 2Kazimierz Drabczyk, Piotr Panek. The influence of porous silicon on junction formation in silicon solar cells [J]. Solar Energy Materials & Solar Cells, 2003, 76:545-551.
  • 3Huang yipping, Zhu shiyang, Bao zongming et al. Gettering of Defects in Silicon by Porous Sillicon [J]. Chinese Journal of Semiconductor, 1998, 19 (12):936-939.
  • 4S. Strehlke, S. Bastide. Optimization of porous silicon reflectance for silicon photovoltaic cells [J ]. Solar Energy Materials & Solar Cells, 1999, 58: 399-409.
  • 5Adamian Z N. Halchoyan A P. Investigations of solar cells with porous silicon as antireflection layer [J ]. Solar Energy Materials & Solar Cells, 2000, 64: 347-351.
  • 6沈天慧,李积和,何莲萍,陈青松,汪师俊.用多晶硅吸杂和SiO_2背封工艺提高硅片质量[J].微电子学与计算机,1997,14(2):17-19. 被引量:5
  • 7程璇,郑玉峰,林昌健,薛茹.化学刻蚀法制备多孔硅的表面形貌研究[J].材料科学与工程,1999,17(3):27-30. 被引量:6

二级参考文献2

  • 1Cheng X,1996 India National Laboratory Confidential Report,1996年
  • 2Lang W,Sensors and Materials,1960年,8卷,6期,327页

共引文献9

同被引文献29

引证文献3

二级引证文献12

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部