硫增感AgBrI T颗粒乳剂光电子行为研究

Application of Microwave Phase-Sensitive Technique in the Study of Photoelectron Action in the Sulfur-Sensitized T-Grains AgBrI Emulsion

利用微波相敏技术,获得了硫增感AgBrIT颗粒乳剂中自由光电子和束缚光电子时间衰减信号,分析了光电子衰减时间、电子陷阱效应、光电子寿命、有效陷阱深度及束缚电子转移时间与增感时间的关系,获得了最佳的增感时间、衰减时间、电子陷阱效应、光电子寿命、有效陷阱深度和转移时间数值.

By microwave phase-sensitive technique, the instantaneous decay signals of free electrons and trapped electrons in AgBrI, which was sulfurized, were obtained. The relationships between sulfurizing time and the decay time of photoelectrons, the effects of electron traps, the lifetime of photoelectrons, the effective depth of traps and the transfer time of trapped electrons, were analyzed. From the experiment results, we got the best values of sulfurizing time, photoelectron decay time, effect of traps, lifetime of photoelectron, effective depth of traps and transfer time of trapped electrons.