摘要
从三线传热方程出发,给出了双层材料的光热偏转光谱的理论模型,讨论了光热偏转信号的特征及其在扫描成象应用中的意义.
A complete theoretical treatment of photothermal deflection spectroscopy (PTDS) for two-layer system samples is given. Characteristics of the optical beam deflection signals under various conditions are discussed in consideration of the scanning microscopic imaging application of PTDS.
出处
《光学学报》
EI
CAS
CSCD
北大核心
1992年第8期729-735,共7页
Acta Optica Sinica
基金
国家自然科学基金资助的项目
关键词
光热偏转光谱
双层结构
PTDS
photothermal deflection spectroscopy, two-layer system.
