利用DIP技术测定荷质比

Measurement of the charge-mass ratio of electron using digital image processing (DIP) technique

将数字图像处理(DIP)技术用于汞546.1nm谱线塞曼分裂横效应π谱线、σ谱线的图像处理,建立了CCD实时测量系统。通过多图像平均,图像细化,取样分析,快速方便地测量计算了电子的荷质比。结果表明,直接测量无法分辨的σ谱线可以通过数字图像处理测量;测量π谱线引起的相对误差小于1%,比直接测量法降低了近一个数量级。

The technique of digital image processing(DIP) is used in Zeeman transverse effect experiment to process π and σ spectral lines generated by Hg 546.1nm line. A real-time CCD measurement system is designed and constructed. The charge-mass ratio can be measured expediently by multiple image averaging, fringe thinning and sample analyzing. It is shown that the DIP technique can measure the σ spectral line that cannot be distinguished by eyepiece directly and the relative error in determining the π spectral line is smaller than 1% ,which is about one order smaller than that measured by eyepiece directly.