摘要
介绍了一种测量X射线的Si-PIN电制冷半导体探测器,以及它在X射线谱分析中的应用。由于该探测器采用了电制冷方法,从而摆脱了传统的Si(Li)探测器在使用和保存时必须定期向其添加液氮的麻烦。
This paper mostly discusses a kind of new type electric refrigeration semiconductor detector that measures X-ray, and its application in X-ray spectrum analysis. By means of electric refrigeration used in the detector, the trouble of adding liquid nitrogen at time is thrown off when traditional Si(Li) semiconductor detector is used and conserved.
出处
《核电子学与探测技术》
CAS
CSCD
北大核心
2004年第1期44-46,共3页
Nuclear Electronics & Detection Technology