摘要
提出了一种采用光学投影成像和自扫描光电二极管列阵(SSPA)传感器实现隐形眼镜曲率、光学中心厚度和直径测量的新方法,基于此方法设计成功了一种新型隐形眼镜投影测量仪。介绍了仪器的测量原理、仪器结构、光电二极管列阵信号采集以及单片机控制系统的硬件和软件设计。该测量仪测量镜片曲率半径的精度优于±0.1mm,测量镜片光学中心厚度的精度优于±0.01mm,测量镜片直径的精度优于±0.1mm,并能分辨镜片上任何方向大于0.01mm的杂质和表面缺陷。
With the demand for contact lenses increasing, measurement instrument and technology are needed for measuring the important parameters of contact lenses. A new method is proposed to use optical projection and self-scanning photodiode array to measure the curvature, optical center thickness and diameter of contact lenses. A new instrument based on the method has been successfully designed for measuring contact lenses. Its precision is superior to ±0.1 mm in lenses curvature, ±0.01 mm in optical center thickness, and ±0.1 mm in diameter. The measuring principal, special construction, signal sampling process of this new instrument and the design of the single-chip microcomputer hardware and software system are discussed in detail.
出处
《光学精密工程》
EI
CAS
CSCD
2004年第3期254-258,共5页
Optics and Precision Engineering
基金
重庆市应用基础研究基金资助项目(No.6169)
关键词
测量投影仪
隐形眼镜
光电二极管
曲率
光学中心厚度
measuring projector
contact lenses
photodiode
curvature
optical center thickness