基于光栅式数字测量仪的统计过程控制

Statistical process control based on high speed laser scan micrometer

选用光栅式数字测量仪、工业PC机和数据采集电路组成一个小型系统,对二极管注胶情况进行检测.仪器与计算机之间进行通信,实现数据的传输,PC机采用统计过程控制的方法分析处理数据,做出直方图和均值 极差(x— R)控制图,反映被测对象质量是否合格的统计规律,不仅实现了对光电二极管注胶的检测功能,而且对改进生产工序、提高产品质量提供了重要的参考信息.

In the test of the cast situation of diodes,the micrometer,industry PC and data collection circuit composes a small system.The micrometer communicates with the PC to transfer data,and the collected data are analysed in the PC by using the method of statistical process control,making histograms and -R control charts,which show the statistical results of the tested objects quality.The histogram shows how frequently data fall within the specific cells,where the process is centered and what is the amount spread about the center.Based on the samples taken from the process,the values of average and range are calculated and plotted on the x—-R control charts and the results are interpreted with respect to control limits,within which the process operates under normal condition.Data points beyond the control limits indicate the special-cause variation.In the test system of the diodes cast situation,the results on the --R control charts indicate which process is out of control and where the faults take place with reference to the cause and effect diagram.This test system not only carries out the function of testing diodes cast situation,but also provides important information about improving working procedure and products quality.