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SOI(绝缘体上硅)的采用日趋活跃 被引量:1

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作者 志成
出处 《电子产品世界》 2004年第05A期97-97,88,共2页 Electronic Engineering & Product World
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  • 1石志宏,李佑斌,李学宁.SiC材料、器件及其应用前景[J].微电子学,1996,26(4):275-278. 被引量:4
  • 2Collinge J P. SOI Technology Materials to VISL[ M]. England:Kluwer Academic Pub, Boston, 1991:1 - 10.
  • 3Adan A O, Naka T, Kagisawa A, et al. SOI as a mainstream IC technology proceedings[C] ill 998 IEEE International SOI Conference, 1998:9.
  • 4SIMOX SOI Advantages [ DB/OL ]. http//www.ibis. com/ad-vantages. html.
  • 5考林基JP.SOI-21世纪的硅集成电路技术[M].科学出版社,.160-161.
  • 6Thomas Scotnicki. Silicon on nothing(SON) -fabrication, material and devices[M]//Cristoloveanu X S, Hemment P L F, Izumi K, et al. Silicon - on - Insulator Technology and Devices, Chicago(USA), 2001: 391.
  • 7Gamble H S. Variants on bonds SOI for advanced ics [M]//Cristoloveanu S X, Hemment P L F, et al. Silicon- on InsuLator Technology and Devices, Chicago (USA), 2001 : 4.
  • 8Gianni Taraschi, Cheng Z Y. Relaxed SiGe on insulator fabrication via wafer bonding and large transfer. Etch - back and smart-cut alternatives[M]//Cristoloveanu X S, Hemment P L F, IzumiK, etal. Silicon-on-Insulator Technology and Devices, Chicago(USA), 2001: 27.
  • 9Chen Z Z, Shen B. Study of transient photoconductivity of GaN epilayer grown by metalorganic chemical vapordeposition [J].Applphys. 1998.67(4), 567 - 570.
  • 10Monfray S, Skotnicki T, Morand Y, et al. First 80 nm SON (silicon- on-nothing) MOSFETS with perfect morphology and high electrical performance[C]. International Electron Devices Meeting, 2001 : 29 - 7.

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