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Carbon nanotubes as tips for atomic force microscopy

Carbon nanotubes as tips for atomic force microscopy
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摘要 Ordinary AFM probes'characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young's modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes ean accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect. Ordinary AFM probes' characters prevent the AFM' s application in various scopes. Carbon nanotubes represent ideal AFM probe materials for their higher aspect ratio, larger Young' s modulus, unique chemical structure, and well-defined electronic property. Carbon nanotube AFM probes are obtained by using a new method of attaching carbon nanotubes to the end of ordinary AFM probes, and are then used for doing AFM experiments. These experiments indicated that carbon nanotube probes have higher elastic deformation, higher resolution and higher durability. And it was also found that carbon nanotube probes can accurately reflect the morphology of deep narrow gaps, while ordinary probes can not reflect.
出处 《Journal of Harbin Institute of Technology(New Series)》 EI CAS 2004年第2期223-227,共5页 哈尔滨工业大学学报(英文版)
基金 Sponsored by the National Natural Science Foundation of China (Grant No. 50202006) the Multidisciline Scientific Research Foundation of Harbin Institute of Technology (Grant No. HIT. MD. 2001.04)
关键词 carbon nanotube atomic force microscope (AFM) PROBE 碳纳米管 探针 原子力显微镜 弹性形变 表面形态 材料
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参考文献8

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