心脏植入式电子设备相关心房颤动最新研究进展

The Research Progress of Cardiac Implantable Electronic Device-Identified Atrial Fibrillation

心脏植入式电子设备的广泛应用,已导致相当比例的患者检测出心房亚临床高频率发作,经腔内心电图确认,大部分是心房纤颤(房颤)或其他心房快速性心律失常。这些无症状性心律失常已经被证明与中风的风险增加和随后发展为临床房颤、心力衰竭等相关。心脏植入电子设备心房颤动不同于临床心房颤动,本综述围绕心脏植入式电子设备相关心房颤动的发病率、发病机制、并发症和治疗等方面最新的研究进展做进一步阐述。

The widespread use of cardiac implantable electronic devices has led to detection in a significant proportion of patients with subclinical high-frequency atrial seizures, confirmed by intraluminal electrocardiography, most of which are atrial fibrillation (AF) or other atrial tachyarrhythmias. These asymptomatic arrhythmias have been shown to be associated with an increased risk of stroke and subsequent development of clinical atrial fibrillation, heart failure, and so on. Atrial fibrillation of cardiac implanted electronic devices is different from clinical atrial fibrillation. This review focuses on the latest research on the incidence, pathogenesis, complications and treatment of atrial fibrillation of cardiac implanted electronic devices.