基于故障字典与分支定界的模拟电路测试点优化方法

An Optimization Method for Test-Point of Analog Circuit Based on Fault Dictionary and the Branch and Bound

为提高测试效率、降低测试代价,提出了一种基于故障字典与分支定界相结合的模拟电路测试点优化方法。以模糊集和故障字典为工具,以故障检测、故障隔离为约束,建立了测试点优化的0~1规划数学模型,并用分支定界法求解,最后用经典的测试优化电路对该方法进行仿真验证。仿真结果表明:上述方法在保证故障诊断需求的前提下实现了测试点快速优化,为实施测试提供了指导。

To improve test efficiency and reduce test cost, an optimization method for test-point of analog circuit based on fault dictionary and the branch and bound is proposed. By the tool of fuzzy sets and fault dictionary, the 0-1 programming model for test-point optimization is established with the constraints of fault detection and fault isolation and the model is solved by the branch and bound method. Finally, the method is verified by simulating on the classic test optimization circuit. Simulation results show that the above method achieves a rapid optimization on the premise of ensuring the fault diagnosis needs and that it provides guidance for the test implementation.