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XPS Studies on Electroless As-Deposited and Annealed Ni-P Films

XPS Studies on Electroless As-Deposited and Annealed Ni-P Films
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摘要 Electroless deposition has been used to deposit Ni-P films on glass slides using the reducing agent sodium hypophosphite. This has been done with a purpose to use Ni-P films as back contact for silicon carbide radiation detectors. By keeping deposition time, temperature, pH and concentration of the precursor solution constant, the film deposition has been done. XPS studies were done to analyze the composition and stoichiometry of Ni-P thin films. Electroless deposition has been used to deposit Ni-P films on glass slides using the reducing agent sodium hypophosphite. This has been done with a purpose to use Ni-P films as back contact for silicon carbide radiation detectors. By keeping deposition time, temperature, pH and concentration of the precursor solution constant, the film deposition has been done. XPS studies were done to analyze the composition and stoichiometry of Ni-P thin films.
作者 Towhid Adnan Chowdhury Towhid Adnan Chowdhury(Department of Electrical & Electronic Engineering, Ahsanullah University of Science & Technology, Dhaka, Bangladesh)
出处 《Engineering(科研)》 2024年第5期123-133,共11页 工程(英文)(1947-3931)
关键词 NI-P X-Ray Photoelectron Spectroscopy ANNEALING Electroless Deposition Binding Energy Reducing Agent Ni-P X-Ray Photoelectron Spectroscopy Annealing Electroless Deposition Binding Energy Reducing Agent
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