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EMF of Hot Charge Carriers Arising at the p-n-Junction under the Influence of the Microwave Field and Light

EMF of Hot Charge Carriers Arising at the p-n-Junction under the Influence of the Microwave Field and Light
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摘要 It is shown that the increase in the current of an asymmetric p-n-junction, caused by perturbation of potential barrier height and increasing recombination current in a strong microwave field, is suppressed by light generated photo carriers, leading to the displacement of current-voltage characteristics of p-n-junction into the direction of smaller current values. It is shown that the increase in the current of an asymmetric p-n-junction, caused by perturbation of potential barrier height and increasing recombination current in a strong microwave field, is suppressed by light generated photo carriers, leading to the displacement of current-voltage characteristics of p-n-junction into the direction of smaller current values.
出处 《Journal of Electromagnetic Analysis and Applications》 2015年第12期302-307,共6页 电磁分析与应用期刊(英文)
关键词 PHOTOCURRENT lasing and recombination currents HOT electrons the microwave field LIGHT p-n-junction photocurrent lasing and recombination currents hot electrons the microwave field light p-n-junction
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