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Optoelectronic Characterization of Chemical Bath Deposited Cd<sub>x</sub>Co<sub>1-x</sub>S Thin Film

Optoelectronic Characterization of Chemical Bath Deposited Cd<sub>x</sub>Co<sub>1-x</sub>S Thin Film
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摘要 Cadmium Cobalt Sulphide (CdxCo1-xS) thin film was deposited on microscopic glass substrate using chemical bath deposition technique at room temperature from aqueous solutions of Cadmium Chloride, Cobalt Chloride and Thiourea in which ammonium solution was used as complexing agents. The optical properties were characterized using the absorbance and transmission measurement from Unico UV-2102 PC spectrophotometer, at normal incidence of light in the wavelength range of 200 - 1000 nm. We report the deposition and optimization of the growth parameter with respect to time which showed that the band gap energy and the composition verified from the extended Vegard’s law are highly dependent on deposition time. The average transmittance of the film in VIS-NIR region ranges between 30% and 78% with absorbance range of 0.15 - 0.47 within the same wavelength range. The film was also observed to exhibit poor reflectance (11 x = 0.75;0.83 and 0.94), respectively. Other optical and dielectric properties of the films were also characterized. Based on the exhibited properties of the film, it can be concluded that it is a promising material for selective coatings for solar cells;effective coatings for poultry houses;use as antireflective coating materials, and for fabrication of optoelectronic devices. Cadmium Cobalt Sulphide (CdxCo1-xS) thin film was deposited on microscopic glass substrate using chemical bath deposition technique at room temperature from aqueous solutions of Cadmium Chloride, Cobalt Chloride and Thiourea in which ammonium solution was used as complexing agents. The optical properties were characterized using the absorbance and transmission measurement from Unico UV-2102 PC spectrophotometer, at normal incidence of light in the wavelength range of 200 - 1000 nm. We report the deposition and optimization of the growth parameter with respect to time which showed that the band gap energy and the composition verified from the extended Vegard’s law are highly dependent on deposition time. The average transmittance of the film in VIS-NIR region ranges between 30% and 78% with absorbance range of 0.15 - 0.47 within the same wavelength range. The film was also observed to exhibit poor reflectance (11 x = 0.75;0.83 and 0.94), respectively. Other optical and dielectric properties of the films were also characterized. Based on the exhibited properties of the film, it can be concluded that it is a promising material for selective coatings for solar cells;effective coatings for poultry houses;use as antireflective coating materials, and for fabrication of optoelectronic devices.
机构地区 不详
出处 《Journal of Modern Physics》 2011年第9期992-996,共5页 现代物理(英文)
关键词 CdxCo1-xS CVD Thin Films Band Gap Vegard’s Law CdxCo1-xS CVD Thin Films Band Gap Vegard’s Law
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