摘要
Graphene Oxide (GO) was chemically synthesized from Natural Flake Graphite (NFG). The GO was chemically reduced to Reduced Graphene Oxide (RGO) using hydrazine monohydrate. Thin films of GO and RGO were also deposited on sodalime glass substrate using spray pyrolysis technique (SPT). The samples were characterized using Fourier Transform Infrared (FTIR) spectroscopy, Scanning Electron Microscopy (SEM) with Energy Dispersive X-Ray (EDS) facility attached to it, UV-Visible Spectrometry and Four-Point probe. The FTIR spectra showed the addition of oxygen functionality groups in GO while such groups was drastically reduced in RGO. SEM micrograph of GO thin film showed a porous sponge-like structure while the micrograph of RGO thin film showed evenly distributed and well connected graphene structure. The EDX spectrum of RGO showed that there was decrease in oxygen content and increase in carbon content of RGO when compared to GO. The optical analysis of the GO and RGO thin films gave a direct energy bandgap of 2.7 eV and 2.2 eV respectively. The value of sheet resistance of GO and RGO films was determined to be 22.9 × 10<sup>6</sup>Ω/sq and 4.95 × 10<sup>6</sup>Ω/sq respectively.
Graphene Oxide (GO) was chemically synthesized from Natural Flake Graphite (NFG). The GO was chemically reduced to Reduced Graphene Oxide (RGO) using hydrazine monohydrate. Thin films of GO and RGO were also deposited on sodalime glass substrate using spray pyrolysis technique (SPT). The samples were characterized using Fourier Transform Infrared (FTIR) spectroscopy, Scanning Electron Microscopy (SEM) with Energy Dispersive X-Ray (EDS) facility attached to it, UV-Visible Spectrometry and Four-Point probe. The FTIR spectra showed the addition of oxygen functionality groups in GO while such groups was drastically reduced in RGO. SEM micrograph of GO thin film showed a porous sponge-like structure while the micrograph of RGO thin film showed evenly distributed and well connected graphene structure. The EDX spectrum of RGO showed that there was decrease in oxygen content and increase in carbon content of RGO when compared to GO. The optical analysis of the GO and RGO thin films gave a direct energy bandgap of 2.7 eV and 2.2 eV respectively. The value of sheet resistance of GO and RGO films was determined to be 22.9 × 10<sup>6</sup>Ω/sq and 4.95 × 10<sup>6</sup>Ω/sq respectively.
作者
M. S. Eluyemi
M. A. Eleruja
A. V. Adedeji
B. Olofinjana
O. Fasakin
O. O. Akinwunmi
O. O. Ilori
A. T. Famojuro
S. A. Ayinde
E. O. B. Ajayi
M. S. Eluyemi;M. A. Eleruja;A. V. Adedeji;B. Olofinjana;O. Fasakin;O. O. Akinwunmi;O. O. Ilori;A. T. Famojuro;S. A. Ayinde;E. O. B. Ajayi(Department of Physics and Engineering Physics, Obafemi Awolowo University, Ile-Ife, Nigeria;Department of Chemistry and Physics, Elizabeth City State University, Elizabeth City, NC, USA;Department of Electronics and Electrical Engineering, Obafemi Awolowo University, Ile-Ife, Nigeria;Department of Chemistry, Obafemi Awolowo University, Ile-Ife, Nigeria)
