摘要
In this investigation, the influence of a thin gold (Au) layer on the growth behavior of the intermetallic compound (IMC) in a Nickel-Tin-Solder (NiSn-Solder) was studied. The reaction kinetics was studied in the temperature range of 232℃ to 330℃ using cross-sectional scanning electron microscope (SEM) images. The kinetics of the reaction was determined using the empirical power law and the research showed that the introduction of an Au layer changes the reaction kinetics of the solder significantly. Furthermore, the change in reaction kinetics was accompanied by a change in morphology of the developing grains. The grain morphology of the IMC was studied for samples annealed at 290℃using cross-sectional and top-view samples and compared to Au free NiSn-Solder.
In this investigation, the influence of a thin gold (Au) layer on the growth behavior of the intermetallic compound (IMC) in a Nickel-Tin-Solder (NiSn-Solder) was studied. The reaction kinetics was studied in the temperature range of 232℃ to 330℃ using cross-sectional scanning electron microscope (SEM) images. The kinetics of the reaction was determined using the empirical power law and the research showed that the introduction of an Au layer changes the reaction kinetics of the solder significantly. Furthermore, the change in reaction kinetics was accompanied by a change in morphology of the developing grains. The grain morphology of the IMC was studied for samples annealed at 290℃using cross-sectional and top-view samples and compared to Au free NiSn-Solder.
作者
Mathias Wendt
Andreas Weimar
Marcus Zenger
Klaus Dilger
Mathias Wendt;Andreas Weimar;Marcus Zenger;Klaus Dilger(Institut für Füge-und Schweiβtechnik, Technische Universität Braunschweig, Braunschweig, Germany;Osram Opto Semiconductors GmbH, Regensburg, Germany)
