摘要
The effect of Zn2+ ions on the microstructure and electrical properties of Mn1-xZnxFe2O4 (0.0 ≤ x ≤ 0.5 in steps of 0.1) through a solid state reaction has been investigated. The structural properties have been investigated using X-ray diffraction (XRD) technique. The XRD analysis confirms that all samples are in a single-phase cubic spinel structure. The experimental lattice parameter (aexp) was decreased with increasing Zn2+ ions substitution due to the smaller ionic radius of zinc content. The crystallite size (t) of samples was estimated by Scherrer’s formula and found in the range (90 - 115 nm). Dc electrical resistivity and Seebeck voltage coefficients were measured as a function of temperature using the two probe methods. The temperature variation of resistivity exhibits two breaks, each break referring to a change in the activation energy. The Curie temperature estimated from dc resistivity measurement decreases with increasing Zn2+ ions. Seebeck voltage coefficient measurements reveal n-type conduction for all samples.
The effect of Zn2+ ions on the microstructure and electrical properties of Mn1-xZnxFe2O4 (0.0 ≤ x ≤ 0.5 in steps of 0.1) through a solid state reaction has been investigated. The structural properties have been investigated using X-ray diffraction (XRD) technique. The XRD analysis confirms that all samples are in a single-phase cubic spinel structure. The experimental lattice parameter (aexp) was decreased with increasing Zn2+ ions substitution due to the smaller ionic radius of zinc content. The crystallite size (t) of samples was estimated by Scherrer’s formula and found in the range (90 - 115 nm). Dc electrical resistivity and Seebeck voltage coefficients were measured as a function of temperature using the two probe methods. The temperature variation of resistivity exhibits two breaks, each break referring to a change in the activation energy. The Curie temperature estimated from dc resistivity measurement decreases with increasing Zn2+ ions. Seebeck voltage coefficient measurements reveal n-type conduction for all samples.
