摘要
Ti4+ doped Ni0.4Cu0.2Zn0.4Fe2-xTixO4 (x = 0.0, 0.02, 0.05, 0.07, 0.10) chemical compositions are prepared by conventional solid state reaction technique. The ferrite phase formation has been confirmed from the pattern of XRD. The theoretical density (ρth), bulk density (ρB), and porosity are calculated from the XRD data and using approximate formulas. Value of ρth is found to be greater than the value of ρB indicating the formation of pores inside the bulk specimens. The micro-structural investigation has been done using Field Emission Scanning Electron Microscope and it is found that the average grain size reduces with the increase of Ti content. Saturation magnetization (Ms) also reduces with the increase of Ti content, contrarily remanent magnetization (Mr) and coercivity (Hc) increases with the concentration of Ti in the composition due to the pinning effect. The real part of the initial permeability is found to be maximum for the x = 0.02 sample which could be due to the homogeneity and high density of the sample. For increasing frequency, the dielectric constant and dielectric loss are observed to decrease.
Ti4+ doped Ni0.4Cu0.2Zn0.4Fe2-xTixO4 (x = 0.0, 0.02, 0.05, 0.07, 0.10) chemical compositions are prepared by conventional solid state reaction technique. The ferrite phase formation has been confirmed from the pattern of XRD. The theoretical density (ρth), bulk density (ρB), and porosity are calculated from the XRD data and using approximate formulas. Value of ρth is found to be greater than the value of ρB indicating the formation of pores inside the bulk specimens. The micro-structural investigation has been done using Field Emission Scanning Electron Microscope and it is found that the average grain size reduces with the increase of Ti content. Saturation magnetization (Ms) also reduces with the increase of Ti content, contrarily remanent magnetization (Mr) and coercivity (Hc) increases with the concentration of Ti in the composition due to the pinning effect. The real part of the initial permeability is found to be maximum for the x = 0.02 sample which could be due to the homogeneity and high density of the sample. For increasing frequency, the dielectric constant and dielectric loss are observed to decrease.
