The relations between the specular reflection component of the intensity scattered by random surfaces and the height distributions of the surfaces are analyzed theoretically. In the extraction of the height distributi...The relations between the specular reflection component of the intensity scattered by random surfaces and the height distributions of the surfaces are analyzed theoretically. In the extraction of the height distribution, both the phase and the amplitude of the specular wave are required. The measured specular intensity data versus the perpendicular component of the wave vector are used for the retrieval of the phase distribution of the specular wave, in which the Gerchberg-Saxton iterative algorithm is employed, and the characterization of the height distribution of random surfaces is accomplished. In the experiment, two samples with Gaussian and quasi-two level height distributions, respectively, are practically measured and the results of the height probability density function obtained by light scattering method are in good accordance with those by atomic force microscopy. The method of this paper is of important significance for the characterizations and studies of random surfaces.展开更多
基金This work was supported by the National Natural Science Foundation of China (Grant No. 69978012)the National Key Basic Research Special Foundation (NKBRSF) of China (Grant No. G1999075200)
文摘The relations between the specular reflection component of the intensity scattered by random surfaces and the height distributions of the surfaces are analyzed theoretically. In the extraction of the height distribution, both the phase and the amplitude of the specular wave are required. The measured specular intensity data versus the perpendicular component of the wave vector are used for the retrieval of the phase distribution of the specular wave, in which the Gerchberg-Saxton iterative algorithm is employed, and the characterization of the height distribution of random surfaces is accomplished. In the experiment, two samples with Gaussian and quasi-two level height distributions, respectively, are practically measured and the results of the height probability density function obtained by light scattering method are in good accordance with those by atomic force microscopy. The method of this paper is of important significance for the characterizations and studies of random surfaces.
