基于边界扫描技术的板级机内测试研究

本文介绍了边界扫描技术及基于边界扫描的板级BIT技术的基本原理，并在此基础上提出了一种板级BIT的实现方案，介绍了测试内容及用到的指令模式。

Research of Board-Level BIT Technology Based on Boundary-Scan Architecture

The boundary scan architecture and its basic principle of board level built in test(BIT) technology are presented. A design for board level built in test and the method to implement test tool are brought forward.