在有关噪声问题的社会调查中,由于不同的研究者采用了不同的调查问题和反应尺度,使得这些研究结果难以进行比较和借鉴。为了解决这个问题,ICBEN Team 6提出了制订标准的噪声社会反应测定方法的提案。本文就是在国际噪声联合专家研究结...在有关噪声问题的社会调查中,由于不同的研究者采用了不同的调查问题和反应尺度,使得这些研究结果难以进行比较和借鉴。为了解决这个问题,ICBEN Team 6提出了制订标准的噪声社会反应测定方法的提案。本文就是在国际噪声联合专家研究结果的基础上,尝试建立中国语标准噪声调查问题和5级噪声反应言语尺度。展开更多
The sputtered Sn-Al and Sn-Cu thin films were used to investigate the effects of the crystallization mechanism and film thickness on the electromagnetic interference （EMI） characteristics. In addition, the annealed ...The sputtered Sn-Al and Sn-Cu thin films were used to investigate the effects of the crystallization mechanism and film thickness on the electromagnetic interference （EMI） characteristics. In addition, the annealed microstructure, electrical conductivities and EMI characteristics of the Sn-xAl films and the Sn-xCu films were compared. The results show that the electromagnetic interference （EMI） shielding of Sn-Al film was increased after annealing. For the Sn-Cu films with higher Cu mole concentration, the low frequency EMI shielding could not be improved. After annealing, the Sn-Cu thin film with lower Cu mole concentration possesses excellent EMI shielding at lower frequencies, but has an inverse tendency at higher frequencies.展开更多
基金the Center for Micro/Nano Science and Technology,National Cheng Kung University(NCKU Project of Promoting Academic Excellence&Developing World Class Research Center:D97-2700)NSC98-2221-E-006-068NSC98-2622-E-006-024-CC3 for the financial support
文摘The sputtered Sn-Al and Sn-Cu thin films were used to investigate the effects of the crystallization mechanism and film thickness on the electromagnetic interference （EMI） characteristics. In addition, the annealed microstructure, electrical conductivities and EMI characteristics of the Sn-xAl films and the Sn-xCu films were compared. The results show that the electromagnetic interference （EMI） shielding of Sn-Al film was increased after annealing. For the Sn-Cu films with higher Cu mole concentration, the low frequency EMI shielding could not be improved. After annealing, the Sn-Cu thin film with lower Cu mole concentration possesses excellent EMI shielding at lower frequencies, but has an inverse tendency at higher frequencies.
