We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with t...We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with the unpolarized object beam to measure the out-of-plane deformation. A modified Mach–Zehnder interferometer is used to measure the two orthogonal slopes of the out-of-plane deformation. One of the object beams of the Mach–Zehnder interferometer is an unpolarized beam, and the other object beam is split into two orthogonal linearly polarized object beams by a polarizing prism. The two beams are orthogonally polarized. Hence, they will not interfere with each other. The two polarized beams respectively interfere with the unpolarized beam to simultaneously measure the two orthogonal slopes of the out-of-plane deformation. In addition, the imaging lens and apertures are respectively placed in three optical paths to independently control the carrier frequencies and shearing amounts. The effectiveness of this method can be proved by measuring two pressure-loaded circular plates.展开更多
In this study,an innovative technique is introduced to significantly enhance the sensitivity of electronic speckle pattern interferometry(ESPI)for the dynamic assessment of specular(mirrorlike)object deformations.By u...In this study,an innovative technique is introduced to significantly enhance the sensitivity of electronic speckle pattern interferometry(ESPI)for the dynamic assessment of specular(mirrorlike)object deformations.By utilizing a common-path illumination strategy,wherein illumination and observation beams are precisely aligned,this method effectively doubles the optical path difference,leading to a twofold increase in measurement sensitivity.In addition,this method mitigates the effects of speckle noise on the measurement of minor deformations,expanding the applications of ESPI.Theoretical and experimental evaluations corroborate the efficacy of this approach.展开更多
基金Project supported by the National Key Research and Development Program of China (Grant No. 2016YFF0101803)the Hefei Municipal Natural Science Foundation (Grant No. 2021017)the Fundamental Research Funds for the Central Universities of China (Grant No. JZ2019HGTB0076)。
文摘We propose a novel system for synchronous measurement of out-of-plane deformation and two orthogonal slopes using a single camera. The linearly polarized reference beam introduced by an optical fiber interferes with the unpolarized object beam to measure the out-of-plane deformation. A modified Mach–Zehnder interferometer is used to measure the two orthogonal slopes of the out-of-plane deformation. One of the object beams of the Mach–Zehnder interferometer is an unpolarized beam, and the other object beam is split into two orthogonal linearly polarized object beams by a polarizing prism. The two beams are orthogonally polarized. Hence, they will not interfere with each other. The two polarized beams respectively interfere with the unpolarized beam to simultaneously measure the two orthogonal slopes of the out-of-plane deformation. In addition, the imaging lens and apertures are respectively placed in three optical paths to independently control the carrier frequencies and shearing amounts. The effectiveness of this method can be proved by measuring two pressure-loaded circular plates.
基金supported by the National Natural Science Foundation of China(Nos.52375536 and 52375535)the Key Research and Development Program of Jiangxi Province(No.20223BBE51010)。
文摘In this study,an innovative technique is introduced to significantly enhance the sensitivity of electronic speckle pattern interferometry(ESPI)for the dynamic assessment of specular(mirrorlike)object deformations.By utilizing a common-path illumination strategy,wherein illumination and observation beams are precisely aligned,this method effectively doubles the optical path difference,leading to a twofold increase in measurement sensitivity.In addition,this method mitigates the effects of speckle noise on the measurement of minor deformations,expanding the applications of ESPI.Theoretical and experimental evaluations corroborate the efficacy of this approach.
