Diamond-like carbon （DLC） films are deposited by the Hall ion source assisted by the mid-frequency unbalanced magnetron sputtering technique. The effects of the substrate voltage bias, the substrate temperature, the...Diamond-like carbon （DLC） films are deposited by the Hall ion source assisted by the mid-frequency unbalanced magnetron sputtering technique. The effects of the substrate voltage bias, the substrate temperature, the Hall discharging current and the argon/nitrogen ratio on the DLC film＇s performance were studied. The experimental results show that the film＇s surface roughness, the hardness and the Young＇s modulus increase firstly and then decrease with the bias voltage incrementally increases. Also when the substrate temperature rises, the surface roughness of the film varies slightly, but its hardness and Young＇s modulus firstly increase followed by a sharp decrease when the temperature surpassing 120 ℃. With the Hall discharging current incrementally rising, the hardness and Young＇s modulus of the film decrease and the surface roughness of the film on 316L stainless steel firstly decreased and then remains constant.展开更多
In this paper, laser melting deposition(LMD), a new advanced manufacture technology. While manufacturing a metal part by LMD process, if we could control the energy distribution in internal different areas such as cla...In this paper, laser melting deposition(LMD), a new advanced manufacture technology. While manufacturing a metal part by LMD process, if we could control the energy distribution in internal different areas such as cladding layer or that between cladding layer and the substrate with optimal process parameters, the probability of internal defects of parts can be reduced, and the mechanical properties of parts will be greatly improved. To address the problem that whether the part made by LMD has internal defects, in this paper we designed the orthogonal rotation experiments through selecting different process parameters. Then a Logistic Regression model was built based on the experiments data. The calculation result of the regression model was in good agreement with the result of authentication test. Therefore, this Logistic Regression model has important reference for selecting LMD process parameters.展开更多
文摘Diamond-like carbon （DLC） films are deposited by the Hall ion source assisted by the mid-frequency unbalanced magnetron sputtering technique. The effects of the substrate voltage bias, the substrate temperature, the Hall discharging current and the argon/nitrogen ratio on the DLC film＇s performance were studied. The experimental results show that the film＇s surface roughness, the hardness and the Young＇s modulus increase firstly and then decrease with the bias voltage incrementally increases. Also when the substrate temperature rises, the surface roughness of the film varies slightly, but its hardness and Young＇s modulus firstly increase followed by a sharp decrease when the temperature surpassing 120 ℃. With the Hall discharging current incrementally rising, the hardness and Young＇s modulus of the film decrease and the surface roughness of the film on 316L stainless steel firstly decreased and then remains constant.
文摘In this paper, laser melting deposition(LMD), a new advanced manufacture technology. While manufacturing a metal part by LMD process, if we could control the energy distribution in internal different areas such as cladding layer or that between cladding layer and the substrate with optimal process parameters, the probability of internal defects of parts can be reduced, and the mechanical properties of parts will be greatly improved. To address the problem that whether the part made by LMD has internal defects, in this paper we designed the orthogonal rotation experiments through selecting different process parameters. Then a Logistic Regression model was built based on the experiments data. The calculation result of the regression model was in good agreement with the result of authentication test. Therefore, this Logistic Regression model has important reference for selecting LMD process parameters.
