Sparse representation has attracted extensive attention and performed well on image super-resolution（SR） in the last decade. However, many current image SR methods face the contradiction of detail recovery and artif...Sparse representation has attracted extensive attention and performed well on image super-resolution（SR） in the last decade. However, many current image SR methods face the contradiction of detail recovery and artifact suppression. We propose a multi-resolution dictionary learning（MRDL） model to solve this contradiction, and give a fast single image SR method based on the MRDL model. To obtain the MRDL model, we first extract multi-scale patches by using our proposed adaptive patch partition method（APPM）. The APPM divides images into patches of different sizes according to their detail richness. Then, the multiresolution dictionary pairs, which contain structural primitives of various resolutions, can be trained from these multi-scale patches.Owing to the MRDL strategy, our SR algorithm not only recovers details well, with less jag and noise, but also significantly improves the computational efficiency. Experimental results validate that our algorithm performs better than other SR methods in evaluation metrics and visual perception.展开更多
[ Objective] The paper was to explore the field evaluation system for resistance of sweet potato stem nematode. [ Method ] The resistance of 52.5 acces- sions was evaluated using naturally induced identification metho...[ Objective] The paper was to explore the field evaluation system for resistance of sweet potato stem nematode. [ Method ] The resistance of 52.5 acces- sions was evaluated using naturally induced identification method in diseased field from 2004 to 2009, and the accessions with resistance were selected. [ Result ] The field evaluation system for resistance of sweet p6tato stem nematode was affected by many factors. Non-uniform incidence in fields led to unstable identification results of certain materials. For test problems, some parameters of the existing evaluation system were corrected to reduce the experimental error. E Conclusion The study provided the reference for further improvement of field evaluation system for resistance of sweet potato stem nematode.展开更多
文摘Sparse representation has attracted extensive attention and performed well on image super-resolution（SR） in the last decade. However, many current image SR methods face the contradiction of detail recovery and artifact suppression. We propose a multi-resolution dictionary learning（MRDL） model to solve this contradiction, and give a fast single image SR method based on the MRDL model. To obtain the MRDL model, we first extract multi-scale patches by using our proposed adaptive patch partition method（APPM）. The APPM divides images into patches of different sizes according to their detail richness. Then, the multiresolution dictionary pairs, which contain structural primitives of various resolutions, can be trained from these multi-scale patches.Owing to the MRDL strategy, our SR algorithm not only recovers details well, with less jag and noise, but also significantly improves the computational efficiency. Experimental results validate that our algorithm performs better than other SR methods in evaluation metrics and visual perception.
基金Supported by Agricultural Science and Technology Innovation Funds of Jiangsu Province[CX(12)2030]
文摘[ Objective] The paper was to explore the field evaluation system for resistance of sweet potato stem nematode. [ Method ] The resistance of 52.5 acces- sions was evaluated using naturally induced identification method in diseased field from 2004 to 2009, and the accessions with resistance were selected. [ Result ] The field evaluation system for resistance of sweet p6tato stem nematode was affected by many factors. Non-uniform incidence in fields led to unstable identification results of certain materials. For test problems, some parameters of the existing evaluation system were corrected to reduce the experimental error. E Conclusion The study provided the reference for further improvement of field evaluation system for resistance of sweet potato stem nematode.
