The reflectometry is a common method used to measure the thickness of thin films. Using a conventional method,its measurable range is limited due to the low resolution of the current spectrometer embedded in the refle...The reflectometry is a common method used to measure the thickness of thin films. Using a conventional method,its measurable range is limited due to the low resolution of the current spectrometer embedded in the reflectometer.We present a simple method, using cubic spline interpolation to resample the spectrum with a high resolution,to extend the measurable transparent film thickness. A large measuring range up to 385 m in optical thickness is achieved with the commonly used system. The numerical calculation and experimental results demonstrate that using the FFT method combined with cubic spline interpolation resampling in reflectrometry, a simple,easy-to-operate, economic measuring system can be achieved with high measuring accuracy and replicability.展开更多
Quantum computing is a rapidly-emerging technology that is widely expected to solve valuable problems in physics and chemistry.After quantum computational advantage in the task of sampling has been demonstrated on bot...Quantum computing is a rapidly-emerging technology that is widely expected to solve valuable problems in physics and chemistry.After quantum computational advantage in the task of sampling has been demonstrated on both photonic and superconductor quantum platforms[1,2],quantum computing is urgently seeking to solve problems of practical interest that are often intractable or at least computationally demanding for classical computers[3].展开更多
基金Supported by the National Natural Science Foundation of China under Grant No 11604115the Educational Commission of Jiangsu Province of China under Grant No 17KJA460004the Huaian Science and Technology Funds under Grant No HAC201701
文摘The reflectometry is a common method used to measure the thickness of thin films. Using a conventional method,its measurable range is limited due to the low resolution of the current spectrometer embedded in the reflectometer.We present a simple method, using cubic spline interpolation to resample the spectrum with a high resolution,to extend the measurable transparent film thickness. A large measuring range up to 385 m in optical thickness is achieved with the commonly used system. The numerical calculation and experimental results demonstrate that using the FFT method combined with cubic spline interpolation resampling in reflectrometry, a simple,easy-to-operate, economic measuring system can be achieved with high measuring accuracy and replicability.
基金supported by the National Natural Science Foundation of China(T2222026,22073086,21825302,and 22288201)Innovation Program for Quantum Science and Technology(2021ZD0303306)+1 种基金Anhui Initiative in Quantum Information Technologies(AHY090400)the Fundamental Research Funds for the Central Universities(WK2060000018)。
文摘Quantum computing is a rapidly-emerging technology that is widely expected to solve valuable problems in physics and chemistry.After quantum computational advantage in the task of sampling has been demonstrated on both photonic and superconductor quantum platforms[1,2],quantum computing is urgently seeking to solve problems of practical interest that are often intractable or at least computationally demanding for classical computers[3].
