针对目前综合能源系统(integrated energy system,IES)因设备种类繁多而优化调度困难、综合能源利用效率较低的问题,提出一种基于广义储能(generalized energy storage,GES)的综合能源系统优化调度模型。首先建立各类不同负荷的GES模型...针对目前综合能源系统(integrated energy system,IES)因设备种类繁多而优化调度困难、综合能源利用效率较低的问题,提出一种基于广义储能(generalized energy storage,GES)的综合能源系统优化调度模型。首先建立各类不同负荷的GES模型,简化了能源调度与消费之间的信息交互,然后基于GES模型建立了日前和日内优化调度模型,为IES能量流分析和优化提供有效途径,最后搭建IES仿真测试系统验证了所提模型的有效性。仿真测试结果表明,该优化模型能充分挖掘负荷的调度潜力,缓解能源调度供需平衡的压力,降低电力系统的运营成本,减少协同分析计算的时间,提升优化调度方法的计算精度和效率。展开更多
The reflectometry is a common method used to measure the thickness of thin films. Using a conventional method,its measurable range is limited due to the low resolution of the current spectrometer embedded in the refle...The reflectometry is a common method used to measure the thickness of thin films. Using a conventional method,its measurable range is limited due to the low resolution of the current spectrometer embedded in the reflectometer.We present a simple method, using cubic spline interpolation to resample the spectrum with a high resolution,to extend the measurable transparent film thickness. A large measuring range up to 385 m in optical thickness is achieved with the commonly used system. The numerical calculation and experimental results demonstrate that using the FFT method combined with cubic spline interpolation resampling in reflectrometry, a simple,easy-to-operate, economic measuring system can be achieved with high measuring accuracy and replicability.展开更多
文摘针对目前综合能源系统(integrated energy system,IES)因设备种类繁多而优化调度困难、综合能源利用效率较低的问题,提出一种基于广义储能(generalized energy storage,GES)的综合能源系统优化调度模型。首先建立各类不同负荷的GES模型,简化了能源调度与消费之间的信息交互,然后基于GES模型建立了日前和日内优化调度模型,为IES能量流分析和优化提供有效途径,最后搭建IES仿真测试系统验证了所提模型的有效性。仿真测试结果表明,该优化模型能充分挖掘负荷的调度潜力,缓解能源调度供需平衡的压力,降低电力系统的运营成本,减少协同分析计算的时间,提升优化调度方法的计算精度和效率。
基金Supported by the National Natural Science Foundation of China under Grant No 11604115the Educational Commission of Jiangsu Province of China under Grant No 17KJA460004the Huaian Science and Technology Funds under Grant No HAC201701
文摘The reflectometry is a common method used to measure the thickness of thin films. Using a conventional method,its measurable range is limited due to the low resolution of the current spectrometer embedded in the reflectometer.We present a simple method, using cubic spline interpolation to resample the spectrum with a high resolution,to extend the measurable transparent film thickness. A large measuring range up to 385 m in optical thickness is achieved with the commonly used system. The numerical calculation and experimental results demonstrate that using the FFT method combined with cubic spline interpolation resampling in reflectrometry, a simple,easy-to-operate, economic measuring system can be achieved with high measuring accuracy and replicability.
