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Comparative study on breakdown characteristics of trigger gap and overvoltage gap in a gas pressurized closing switch 被引量:2
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作者 Rongxiao ZHAI Tao HUANG +4 位作者 peitian cong Weixi LUO Zhiguo WANG Tianyang ZHANG Jiahui YIN 《Plasma Science and Technology》 SCIE EI CAS CSCD 2019年第1期87-92,共6页
Gas pressurized closing switches are one of the most important elements in FLTD-based systems. Improving the trigger performance of gas switches is useful for optimizing the output parameters and the reliability of th... Gas pressurized closing switches are one of the most important elements in FLTD-based systems. Improving the trigger performance of gas switches is useful for optimizing the output parameters and the reliability of the FLTD. In this paper, the breakdown characteristics of the trigger gap and the overvoltage gap are studied experimentally. The reasons for the different breakdown performance of the two gaps are also investigated. The results show that the breakdown delay of the trigger gap is more influenced by the trigger voltage, while the breakdown delay of the overvoltage gap is more influenced by the working coefficient and always higher than that of the trigger gap. The jitter of the trigger gap is more influenced by the trigger voltage and accounts more than 60% of the total switch jitter, while the jitter of the overvoltage gap is hardly changed with the trigger voltage as well as the working coefficient and maintains less than 1.4 ns. It is proved that the discharging product from the trigger gap can effectively reduce the breakdown delay and jitter of the overvoltage gap. Based on that, the effect and improvement of pre-ionization on the two gaps are also studied. It is concluded that the jitter of the trigger gap reduces obviously when the pre-ionization is added, while the pre-ionization almost has no effect on the jitter of the overvoltage gap. The jitter of the overvoltage gap is about two times higher than the trigger gap in the pre-ionizing switch. 展开更多
关键词 gas SWITCH breakdown characteristic pre-ionization TRIGGER GAP OVERVOLTAGE GAP
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Experimental study of current loss of a single-hole post-hole convolute on the QG I generator 被引量:1
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作者 Hanyu WU Zhengzhong ZENG +4 位作者 Mengtong QIU peitian cong Jinhai ZHANG Xinjun ZHANG Ning GUO 《Plasma Science and Technology》 SCIE EI CAS CSCD 2020年第1期104-110,共7页
The post-hole convolute(PHC),which is used to transport and combine the pulse power flux,is a key component in huge pulsed power generators.Current loss at the PHC is a challenging problem for researchers.To explore a... The post-hole convolute(PHC),which is used to transport and combine the pulse power flux,is a key component in huge pulsed power generators.Current loss at the PHC is a challenging problem for researchers.To explore a method of reducing the current loss,a single-hole PHC was designed for experiments on the current loss on the Qiang Guang I generator.The experimental results showed that the current loss at the single-hole PHC is related to the distance/between the vicinity of the cathode hole and the surface of the downstream side of the post.Meanwhile,a single-hole PHC with a blob cathode hole transmitted current more effectively than the PHC with a circle cathode hole.The relative current loss at the single-hole PHC with the cathode coaled w ith gold foil was about 30%-50% of that with the cathode coated with nickel and titanium foil.The gap closing speed was also obtained from the current waveforms in the experiments.The speed was 5.74-14.52 cmμs 1 which was different from the classical plasma expansion velocity of 3 cmμs 1. 展开更多
关键词 plasma post-hole convolute magnetic insulation current loss
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纳米器件空间辐射效应机理和模拟试验技术研究进展 被引量:14
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作者 陈伟 刘杰 +21 位作者 马晓华 郭刚 赵元富 郭晓强 罗尹虹 姚志斌 丁李利 王晨辉 陈荣梅 何宝平 赵雯 张凤祁 马武英 翟鹏飞 王祖军 刘天奇 郭红霞 刘建德 杨海亮 胡培培 丛培天 李宗臻 《科学通报》 EI CAS CSCD 北大核心 2018年第13期1211-1222,共12页
电子器件空间辐射效应是影响航天器在轨长期可靠运行的重要因素之一,一直是国际上抗辐射加固技术领域研究的热点和难点.高可靠、高集成度、高性能、低功耗、低成本是未来新一代先进电子系统发展的必然要求,采用更高性能的抗辐射加固纳... 电子器件空间辐射效应是影响航天器在轨长期可靠运行的重要因素之一,一直是国际上抗辐射加固技术领域研究的热点和难点.高可靠、高集成度、高性能、低功耗、低成本是未来新一代先进电子系统发展的必然要求,采用更高性能的抗辐射加固纳米器件是必然的趋势.本文在深入调研国内外研究现状的基础上,分析了纳米器件辐射效应面临的新问题.纳米工艺存在着很多不同于大尺寸工艺的特点,沟道长度缩小到十几个纳米,栅氧化层等效厚度小于1 nm.在工艺上引入了纵向逆掺杂阱或横向晕环掺杂技术,以降低栅极诱导漏极漏电效应;在材料上引入了多元半导体材料、应变硅、锗硅、高k栅介质、金属栅极等,以降低器件功耗;在结构上引入了三维Fin FET结构,以增强栅的控制能力.这种趋于物理极限的工艺特点、新材料和新结构的采用产生了许多新的辐射效应现象和机制,模拟试验技术更加复杂,给抗辐射加固技术研究带来了新的挑战.本文综述了纳米器件辐射效应的研究现状和趋势,重点针对28 nm及以下特征工艺纳米器件辐射效应研究及模拟试验的需求,提出了需要研究的科学问题和关键技术,希望能为纳米器件抗辐射加固与空间应用提供参考. 展开更多
关键词 纳米器件 空间辐射效应 抗辐射加固 模拟试验
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Z箍缩等离子体X射线产生及应用分析 被引量:4
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作者 杨海亮 邱爱慈 +9 位作者 陈伟 王亮平 李沫 张金海 孙凤举 张鹏飞 吴撼宇 丛培天 吴伟 吴刚 《科学通报》 EI CAS CSCD 北大核心 2020年第11期966-972,共7页
MA级脉冲大电流通过丝阵或气体等负载放电时,负载被加热电离形成等离子体.等离子体在流过自身的轴向大电流产生自磁场的洛仑兹力作用下,向轴线作内聚运动发生自箍缩,最终在对称轴附近滞止,动能转换成等离子体内能,提高了等离子体温度,... MA级脉冲大电流通过丝阵或气体等负载放电时,负载被加热电离形成等离子体.等离子体在流过自身的轴向大电流产生自磁场的洛仑兹力作用下,向轴线作内聚运动发生自箍缩,最终在对称轴附近滞止,动能转换成等离子体内能,提高了等离子体温度,通过线辐射、复合辐射和轫致辐射产生脉冲强X射线[1].Z箍缩(Z-pinch)等离子体终态形状为沿轴线的线状流体;θ箍缩是由角向电流引起的箍缩,其等离子体终态形态为沿角向分布的流体. 展开更多
关键词 洛仑兹力 X射线 终态 等离子体温度 复合辐射 动能转换 轫致辐射 对称轴
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