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Scaling analysis of current influence on Hastelloy surface roughness in electro-polishing process
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作者 Feng Feng xiang-song zhang +5 位作者 Ti-Ming Qu Yan-Yi zhang Xiang Qian Bin-Bin Liu Jun-Long Huang Ping-Fa Feng 《Rare Metals》 SCIE EI CAS CSCD 2019年第2期142-150,共9页
In this study, a series of Hastelloy tapes were electro-polished, and the dividing method was used to carry out a detailed investigation on the influence of polishing current(I) on root mean square(R_q) at various ima... In this study, a series of Hastelloy tapes were electro-polished, and the dividing method was used to carry out a detailed investigation on the influence of polishing current(I) on root mean square(R_q) at various image scales(L). The electro-polishing is found to be effective mainly at L smaller than 10μm, where the R_q–I relationship could be fitted by an exponential decay function with a residual roughness value. An approximate model of electro-polishing process was established to interpret the exponential decay function. This study provides a quantified insight into the electro-polishing process, which could help to obtain more understanding of its mechanism. 展开更多
关键词 Surface ROUGHNESS Scaling analysis ROOT mean square Atomic force microscopy Electro-polishing
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